Technical Program

315: Materials and Propagation Measurements

Session Type: Oral
Time: Wednesday, July 9, 10:00 - 11:40
Location: L13
Session Chairs: Jeff Guerrieri, National Institute of Standards and Technology and Dean Arakaki, California Polytechnic State University
 
315.1: MEASUREMENT OF PAINT AND COATING THICKNESS ON METALLIC PLATES USING SMART NEAR FIELD MICROWAVE SENSOR
         Abdulbaset Ali; University of Waterloo, Canada
         Muhammed S. Boybay; Antalya International University, Turkey
         Omar Ramahi; University of Waterloo, Canada
 
315.2: W-BAND SILICON DIELECTRIC MEASUREMENT
         Mehdi Seyyed-Esfahlan; Sabanci University, Turkey
         Muhammed Hossein Nemati; Sabanci University, Turkey
         Ibrahim Tekin; Sabanci University, Turkey
 
315.3: ORGANIC-BASED MICROWAVE FREQUENCY ABSORBERS USING CORN STOVER
         Ben Smythe; Agilent Technologies, United States
         Sean Casserly; TDK Corp., United States
         Dean Arakaki; Cal Poly State University, United States
 
315.4: A SYSTEM FOR MEASURING THROUGH-THE-EARTH RADIO PROPAGATION
         Carl Sunderman; NIOSH/OMSHR, United States
         Lincan Yan; NIOSH/OMSHR, United States
         Bruce Whisner; NIOSH/OMSHR, United States
         Joseph Waynert; NIOSH/OMSHR, United States
 
315.5: QUALITATIVE ANALYSIS OF MOISTURE CONTENT IN CEMENT BASED MATERIAL USING MICROWAVE NON-DESTRUCTIVE TESTING
         Sonu Lal Gupta; Indian Institute of Technology Kanpur, India
         Zubair Akhter; Indian Institute of Technology Kanpur, India
         Manoj Bhaskar; Indian Institute of Technology Kanpur, India
         M Jaleel Akhtar; Indian Institute of Technology Kanpur, India