Technical Program

231: Advanced Materials and Metrology

Session Type: Oral
Time: Tuesday, July 8, 13:20 - 17:00
Location: L6
Session Chairs: Steven Weiss, U.S. Army and Zhongxiang Shen, Nanyang Technological University
 
231.1: COMPLEMENTARY FREQUENCY SELECTIVE SURFACES FOR DIELECTRIC MEASUREMENTS
         Chinwe Njoku; Loughborough University, United Kingdom
         Yiannis Vardaxoglou; Loughborough University, United Kingdom
         William G. Whittow; Loughborough University, United Kingdom
 
231.2: GYROMAGNETIC MATERIAL CHARACTERIZATION AND ERROR ANALYSIS USING A PARTIALLY-FILLED WAVEGUIDE TECHNIQUE
         Junyan Tang; Michigan State University, United States
         Benjamin Crowgey; Michigan State University, United States
         Edward Rothwell; Michigan State University, United States
         Balasubramaniam Shanker; Michigan State University, United States
         Leo Kempel; Michigan State University, United States
         Michael Havrilla; Air Force Institute of Technology, United States
 
231.3: MODELING OF ANISOTROPIC METAMATERIALS AS AN EFFECTIVE MEDIUM
         Gregory Mitchell; U.S. Army Research Laboratory, United States
 
231.4: MATERIAL CHARACTERIZATION USING A TWO-WIRE TRANSMISSION LINE
         Andrew Temme; Michigan State University, United States
         Edward Rothwell; Michigan State University, United States
 
231.5: SUBSTRATES WITH NON-UNIFORM 3D GEOMETRIES FOR MINIATURIZATION OF MICROSTRIP PATCH ANTENNAS AND AESTHETIC DESIGN
         William G. Whittow; Loughborough University, United Kingdom
         Alireza Motevasselian; Loughborough University, United Kingdom
 
231.6: MULTIFERROIC THIN FILM CIRCULATOR WITH TUNABLE BANDPASS BEHAVIOR
         Xi Yang; University of California, Los Angeles, United States
         Yuanxun Wang; University of California, Los Angeles, United States
 
231.7: DUAL CHAMBER TRANSMISSION/REFLECTION METHOD FOR HIGH TEMPERATURE ELECTROMAGNETIC MATERIAL CHARACTERIZATION
         Andrew Bogle; University of Dayton Research Institute, United States
         Michael Havrilla; Air Force Institute of Technology, United States
         Milo Hyde IV; Air Force Institute of Technology, United States
 
231.8: FREE-SPACE CHARACTERIZATION OF CONDUCTOR-BACKED ABSORBING MATERIALS USING AN APERTURE SCREEN
         Korede Akinlabi-Oladimeji; Michigan State University, United States
         Edward Rothwell; Michigan State University, United States
         Prem Chahal; Michigan State University, United States
 
231.9: ANALYSIS AND DESIGN OF FREQUENCY SELECTIVE ABSORBERS
         Bo Li; Nanyang Technological University, Singapore
         Zhongxiang Shen; Nanyang Technological University, Singapore
         Yuping Shang; University of Electronic Science and Technology of China, China
 
231.10: MODELING ARRAY OF ECCENTRIC CORE-SHELL PLASMONIC SPHERES
         Masoud Rostami; Northeastern University, United States
         Hossein Mosallaei; Northeastern University, United States