Technical Program

339: Phased Array Calibration and Near Field Sampling

Session Type: Oral
Time: Wednesday, July 9, 15:20 - 16:40
Location: L14
Session Chairs: William Barott, Embry-Riddle Aeronautical University and Gijo Augustin, National Institute of Scientific Research (INRS), CANADA
 
339.1: REDUCTION OF NEAR-FIELD GRATING LOBES IN SPARSE LINEAR PHASED ARRAYS
         Dylan Rudolph; University of Florida, United States
         William Barott; Embry-Riddle Aeronautical University, United States
 
339.2: MODELING UNCERTAINTY IN PHASED ARRAYS THROUGH THE INTERVAL ANALYSIS
         Paolo Rocca; ELEDIA Research Center@DISI, University of Trento, Italy
         Nicola Anselmi; ELEDIA Research Center@DISI, University of Trento, Italy
         Lorenzo Poli; ELEDIA Research Center@DISI, University of Trento, Italy
         Luca Manica; ELEDIA Research Center@DISI, University of Trento, Italy
         Ennio Giaccari; Corporate Technology Office Finmeccanica, Italy
         Andrea Massa; ELEDIA Research Center@DISI, University of Trento, Italy
 
339.3: ON THE INDUSTRIAL EXPERIMENTAL VALIDATION OF AESA BY MEANS OF NON REDUNDANT SAMPLING STRATEGIES
         Pietro Vinetti; Selex ES, Italy
         Michele D'Urso; Selex ES, Italy
         Mario Teglia; Selex ES, Italy
         Maurizio Cicolani; Selex ES, Italy
 
339.4: CALIBRATION METHOD OF PHASED ARRAY BASED ON NEAR-FIELD MEASUREMENT SYSTEM
         Rui Long; University of Electronic Science and Technology of China, China
         Jun Ouyang; University of Electronic Science and Technology of China, China
         Feng Yang; University of Electronic Science and Technology of China, China
         Yan Li; University of Electronic Science and Technology of China, China
         Kaizhi Zhang; University of Electronic Science and Technology of China, China
         Longjian Zhou; University of Electronic Science and Technology of China, China